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List of Past Events
Measuring and Modeling Skin Texture
Monday, February 05, 2007, 01:00pm - 02:00pm
Rutgers University, Electrical & Computer Engineering
Modeling of human skin texture is an important and a challenging task. The appearance of fine-scale structures on the skin surface depends greatly on imaging parameters. Our approach is to acquire face images from multiple viewpoints and illumination directions and model the skin texture. Additionally, we use polarization sensitive imaging to separate surface and subsurface components. While subsurface reflectance of skin has received significant attention in the literature, fine-scale geometry of the skin surface is more apparent in the surface component. As such, polarization-based acquisition of the surface component is important in measurements. In this talk we review our work on modeling and measuring facial skin texture. We also discuss our recent work in augmenting high resolution image-based measurements with 3D modeling of head geometry. Potential applications of this work include: (1) Realistic rendering of human faces which represent details like scars or wrinkles (2) Refined face recognition to distinguish among doubles (3) Change detection for dermatology where appearance changes of interest are those due to morphology change, not imaging parameter changes.